Environmental Stress Screening

Problems and reference sections are included in each chapter.

Preface

Chapter 1–Introduction

• Why ESS?
• How ESS Works
• What This Book Offers?

Chapter 2–Historical Perspective of ESS

Chapter 3–ESS Defintions, Basic Concepts and Common Misconceptions

• What Is ESS?
• Definitions and Acronyms of Frequently Used Terms in ESS
• Common Misconceptions about ESS

Chapter 4–ESS Types and Their Effectiveness

• Flaw-Stimulus Relationships
• ESS Types
• Screen Parameters
• Popularity and Effectiveness of ESS Types
• Advantages of Temperature Cycling

Chapter 5–ESS Standards and Documents for Electronic Assemblies

• Background
• An Updated Overview

Chapter 6–The Statistical Quantification and Optimization Of ESS

• Introduction
• Assumptions
• Part Level Screening
• System Level Screening
• Two-Level Screening: The Life-Cycle Cost Model
• Bayesian Approach to ESS
• Comments
• Appendix 6a
• Appendix 6b

Chapter 7–Physical Quantification of ESS by Thermal Cycling

• The Arrhenius Model and Its Pitfalls
• Modification and Parameter Estimation of the Acceleration Factor Equation
• Temperature Profile and the Model for the Acceleration Factor
• Equivalent Acceleration Factor Evaluation Using Eq. (7.26)
• Equivalent Acceleration Factor Evaluation Using Eq. (7.27)
• Application of the Aging Acceleration Models
• Optimum Number of Thermal Cycles for a Specified Field MTBF Goal
• A Summary of Some Useful Thermal Fatigue Life Prediction Models for Electronic Equipment
• Conclusions
• Appendix 7a
• Appendix 7b

Chapter 8–Physical Quantification and Optimization of ESS by Random Vibration

• Introduction
• Fundamental Theory of a Random Process
• Failure Due To Random Vibration and Structural Reliability Evaluation
• Obtain the Stress Response PSD Function from Finite Element Analysis

Chapter 9–ESS by Combined Environments Thermal Cycling and Random Vibration

• Introduction
• The Thermal Fatigue Life Model
• The Random Vibration Fatigue Life Model
• Combined Reliability Analysis
• Optimum Screening Strategy

Chapter 10–ESS by Applying Multiple Stresses

• Aging Acceleration under Multiple-Stresses Effect Dependency Test
• Of Combined Stresses
• An Economic Model for Optimum Stress Regimen Determination for a Multiple-Stress Assembly-Level Stress Screen
• Comments

Chapter 11–Screening Strength and the Related Empirical Equations in ESS

• Definition of Screening Strength
• Screening Strength under Different Screening Stresses
• Average Defect Failure Rate Estimation under Different Screening Stresses
• Model Applicability

Chapter 12–ESS Planning

• Introduction
• Establishment of the Remaining Defect Density Objectives
• Incoming Defect Density Estimation
• Screening Parameter Selection
• Screening Strength
• Test Detection Efficiency
• Test Strength
• Procedure for Quantification Selection
• Economic Optimization of ESS Planning

Chapter 13–Tailoring Technique in ESS

• The Mechanics of Tailoring
• Stress Response Survey
• Tailoring Of Environmental Stresses

Chapter 14–Monitoring, Control and Evaluation of ESS

• Introduction
• Data Collection and Failure Classification
• Monitoring and Control in the Screening Process
• Evaluation for the Screening Process

Chapter 15–An Application Of DOD-Hdbk-344 In Developing A Closed-Loop Dynamic ESS Program

• Introduction
• Product Description
• Closed-Loop ESS Process
• Incoming Defect Prediction
• Screening Selection and Placement
• Data Collection
• Data Analysis and Process Monitoring
• Failure Cause Investigation and Corrective Actions
• Conclusions

Chapter 16–ESS Case Histories

• ESS in the Apollo Space Program
• ESS on New Printers in IBM
• ESS on Switching Logic Units at Lockheed
• American Airlines ESS Demonstration
• Power Supply Random Vibration Stress Screening at Zytec
• Thermal Cycling Screening of a Spacecraft at Hughes
• ESS on Shipboard Militarized Digital Computer
• Random Vibration of an Airborne Digital Computer
• Random Vibration Screen of an Advanced Signal Processor
• Thermal Cycling Screening on Airborne Radar Module
• Strife Test Program in Hewlett-Packard
• Strife Testing At Zytec Helps the Company Win Baldrige
• Cost Effectiveness of ESS Demonstrated At Robins Air Force Base
• Random Vibration Screening Of Militarized Avionic Computers at IBM
• ESS of A High-Density Surface Mount Circuit Card At At&T Little Rock
• Automated ESS Optimization for U.S. Army Electronic Hardware
• ESS As Applied To a New Computer